半导体事业

砷化镓基板

本公司的砷化镓基板大量应用于DVD等激光设备以及LED、手机等电子设备,用途广泛。

砷化镓基板
用途
  • 应用于大功率LD、VCSEL、Micro LED及显示屏LED基板。
高功率工业用激光器

高功率工业用激光器

产品特点
  • 通过VGF法和LEC法培养单晶。
  • 拥有高度控制载流子浓度、低EPD等特点。

VGF-n 型

VGF-n 型, LD grade VGF-n 型, LED grade
Crystal growth method VGF (vertical gradient freezing) method VGF (vertical gradient freezing) method
Dopant and conductive type N type: Si-doped N type: Si-doped
Carrier density N-type (0.4-4)×1018 cm-3
(Adjustable within the above range)
N-type (0.4-4)×1018 cm-3
(Adjustable within the above range)
Dislocation density(EPD)
(cm-2)
EPDave</=500(LED)
EPDmax</=5000(LED)
EPDave</=500(LED)
EPDmax</=5000(LED)
Size 6-inch 4-inch 3-inch 2-inch 6-inch 4-inch 3-inch 2-inch
Plane orientation 1. (100)±0.1°
2. (100) off α°±0.1° towards (011) or (01-1) etc.
3. We will aim to meet your requests.
1. (100)±0.1°
2. (100) off α°±0.1° towards (011) or (01-1) etc.
3. We will aim to meet your requests.
Diameter
(mm)
150.0±0.1 100.0±0.1 76.0±0.1
76.2±0.1
50.0±0.1
50.8±0.1
150.0±0.2 100.0±0.2 76.0±0.2
76.2±0.2
50.0±0.2
50.8±0.2
Thickness
(μm)
450-675
±15
350-625
±15
300-600
±15
240-450
±15
450-675
±20
350-625
±20
300-600
±20
240-450
±20
Orientation flat length
OF(mm)
IF(mm)
48.0±1.0
30.0±1.0
32.5±1.0
18.0±1.0
22.0±1.0
12.0±1.0
16.0±1.0
8.0±1.0
48.0±1.0
30.0±1.0
32.0±1.0
18.0±1.0
22.0±1.0
12.0±1.0
16.0±1.0
8.0±1.0
(Adjustable upon request) (Adjustable upon request)
Orientation flat direction
OF(mm)
IF(mm)
EJ (Dove-Tail):[OF] (0-1-1)±0.05°/ [IF](0-11)±0.5°
or
SEMI US (V-Groove):[OF] (01-1)±0.05°/ [IF](011)±0.5°
(Adaptable to both cleavage and bevel)
EJ (Dove-Tail):[OF] (0-1-1)±0.5°/ [IF](0-11)±0.5°
or
SEMI US (V-Groove):[OF] (01-1)±0.5°/ [IF](011)±0.5°
Notch OK Not allowed Not allowed Not allowed OK Not allowed Not allowed Not allowed
Edge rounding Beveled Beveled
Metalworking precision
TTV(μm)
<5.0 <5.0 <5.0 <5.0 <10.0 <10.0 <10.0 <10.0
Metalworking precision
Warp(μm)
<10.0 <10.0 <10.0 <10.0 <15.0 <15.0 <15.0 <15.0
Surfacing
Surface
Mirror Mirror
Surfacing
Back
Post-lap etching (mirror processing is also available) Post-lap etching (mirror processing is also available)
Surface processing Epi-ready Epi-ready
Laser mark Option Option
Packaging form Cassette Cassette or individual packaging tray Cassette Cassette or individual packaging tray

VGF-p型

VGF-p型 Zn-doped VGF-p型 Zn- and Si-doped
Carrier density VGF (vertical gradient freezing) method VGF (vertical gradient freezing) method
Dopant and conductive type P type: Zn-doped P type: Zn- and Si-doped
Carrier density P-type (0.5-3)×1019 cm-3
(Adjustable within the above range)
P-type (0.5-3)×1019 cm-3
(Adjustable within the above range)
Dislocation density (EPD) (cm-2) EPDave</=3000
EPDmax</=10000
EPDave</=1500
EPDmax</=10000
Size 3-inch 2-inch 3-inch 2-inch
Plane orientation 1. (100)±0.1°
2. (100) off α°±0.1° towards (011) or (01-1) etc.
3. We will aim to meet your requests.
1. (100)±0.1°
2. (100) off α°±0.1° towards (011) or (01-1) etc.
3. We will aim to meet your requests.
Diameter (mm) 76.0±0.1
76.2±0.1
50.0±0.1
50.8±0.1
76.0±0.1
76.2±0.1
50.0±0.1
50.8±0.1
Thickness (μm) 300-600
±15
240-450
±15
300-600
±15
240-450
±15
Orientation flat length OF(mm)
IF(mm)
22.0±1.0
12.0±1.0
16.0±1.0
8.0±1.0
22.0±1.0
12.0±1.0
16.0±1.0
8.0±1.0
(Adjustable upon request) (Adjustable upon request)
Orientation flat direction OF(mm)
IF(mm)
EJ (Dove-Tail):[OF] (0-1-1)±0.05°/ [IF](0-11)±0.5°
or
SEMI US (V-Groove):[OF] (01-1)±0.05°/ [IF](011)±0.5°
(Adaptable to both cleavage and bevel)
EJ (Dove-Tail):[OF] (0-1-1)±0.05°/ [IF](0-11)±0.5°
or
SEMI US (V-Groove):[OF] (01-1)±0.05°/ [IF](011)±0.5°
(Adaptable to both cleavage and bevel)
Edge rounding Beveled Beveled
Metalworking precision TTV(μm) <5.0 <5.0 <5.0 <5.0
Warp(μm) <10.0 <10.0 <10.0 <10.0
Surfacing Surface Mirror Mirror
Back Post-lap etching (mirror processing is also available) Post-lap etching (mirror processing is also available)
Surface processing Epi-ready
Laser mark Option Option
Packaging form Cassette or individual packaging tray Cassette or individual packaging tray

半绝缘性能

VGF 半绝缘性能 LEC 半绝缘性能
Carrier density VGF (vertical gradient freezing) method LEC (Liquid Encapsulated Czochralski) method
Dopant and conductive type 半绝缘性能: Undoped (C-doped) 半绝缘性能: Undoped (C-doped)
Resistivity (at 25℃) >/=1×107 Ω cm
(Adjustable within the above range)
>/=1×107 Ω cm
(Adjustable within the above range)
Dislocation density (EPD)
(cm-2)
EPDave</=5000 EPDave</=10^5
Size 4-inch 3-inch 2-inch 4-inch 3-inch 2-inch
Plane orientation 1. (100)±0.1°
2. (100) off 2°±0.1° towards (110) etc.
3. We will aim to meet your requests.。
1. (100)±0.1°
2. (100) off 2°±0.1° towards (110) etc.
3. We will aim to meet your requests.。
Diameter
(mm)
100.0±0.1 76.0±0.1
76.2±0.1
50.0±0.1
50.8±0.1
100.0±0.1 76.0±0.1
76.2±0.1
50.0±0.1
50.8±0.1
Thickness
(μm)
450-625
±15
350-625
±15
300-450
±15
450-625
±15
350-625
±15
300-450
±15
Orientation flat length
OF(mm)
IF(mm)
32.0±1.0
18.0±1.0
22.0±1.0
12.0±1.0
16.0±1.0
8.0±1.0
32.0±1.0
18.0±1.0
22.0±1.0
12.0±1.0
16.0±1.0
8.0±1.0
(Adjustable upon request) (Adjustable upon request)
Orientation flat direction
OF(mm)
IF(mm)
EJ (Dove-Tail):[OF] (0-1-1)±0.5°/ [IF](0-11)±0.5°
or
SEMI US (V-Groove):[OF] (01-1)±0.5°/ [IF](011)±0.5°
EJ (Dove-Tail):[OF] (0-1-1)±0.5°/ [IF](0-11)±0.5°
or
SEMI US (V-Groove):[OF] (01-1)±0.5°/ [IF](011)±0.5°
Edge rounding Beveled Beveled
Metalworking precision
TTV(μm)
<5.0 <5.0 <5.0 <5.0 <5.0 <5.0
Metalworking precision
TIR(μm)
<5.0 <5.0 <5.0 <5.0 <5.0 <5.0
Metalworking precision
Warp(μm)
<10.0 <10.0 <10.0 <10.0 <10.0 <10.0
Surfacing
Surface
Post-lap etching (mirror processing is also available) Post-lap etching (mirror processing is also available)
Surfacing
Back
Post-lap etching (mirror processing is also available) Post-lap etching (mirror processing is also available)
Surface processing Epi-ready Epi-ready
Laser mark Option Option
Packaging form Cassette or individual packaging tray Cassette or individual packaging tray

咨询

咨询

同和电子科技有限公司 半导体事业部
东京都千代田区外神田四丁目14番1号 秋叶原UDX 22层
TEL:+81-3-6847-1253  FAX:+81-3-6847-1260